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Capacitance of graphene bilayer as a probe of layer-specific properties

机译:石墨烯双层的电容作为层特定性质的探针

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摘要

The unique capabilities of capacitance measurements in bilayer graphene enable probing of layer-specific properties that are normally out of reach in transport measurements. Furthermore, capacitance measurements in the top-gate and penetration field geometries are sensitive to different physical quantities: The penetration field capacitance probes the two layers equally, whereas the top-gate capacitance preferentially samples the near layer, resulting in the "near-layer capacitance enhancement" effect observed in recent top-gate capacitance measurements. We present a detailed theoretical description of this effect and show that capacitance can be used to determine the equilibrium layer polarization, a potentially useful tool in the study of broken symmetry states in graphene, stemming from the interplay between interlayer screening, disorder, and the inverse-square-root van Hove singularity particular to the bilayer graphene band structure. We show how capacitance experiments can be used to probe the ground-state layer polarization, a potentially useful tool in the study of broken symmetry states in graphene.
机译:双层石墨烯中电容测量的独特功能使得能够探测通常在传输测量中无法达到的特定于层的特性。此外,在顶栅和穿透场几何形状中的电容测量值对不同的物理量敏感:穿透场电容会平等地探测两层,而顶栅电容会优先采样近层,从而导致“近层电容”在最近的顶栅电容测量中观察到“增强”效应。我们提供了对此效应的详细理论描述,并表明电容可用于确定平衡层极化,这是研究石墨烯中对称对称状态破坏的潜在有用工具,其源于层间筛选,无序和逆之间的相互作用平方根van Hove奇异性特定于双层石墨烯能带结构。我们展示了如何使用电容实验来探测基态层极化,这是研究石墨烯中对称对称状态破裂的潜在有用工具。

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